Multi-Parametric MRI and Texture Analysis to Visualize Spatial Histologic Heterogeneity and Tumor Extent in Glioblastoma
Background: Genetic profiling represents the future of neuro-oncology but suffers from inadequate biopsies in heterogeneous tumors like Glioblastoma (GBM). Contrast-enhanced MRI (CE-MRI) targets enhancing core (ENH) but yields adequate tumor in only ~60% of cases. Further, CE-MRI poorly localizes infiltrative tumor within surrounding non-enhancing parenchyma, or brain-around-tumor (BAT), despite the importance of characterizing this tumor segment, which universally recurs. In this study, we use multiple texture analysis and machine learning (ML) algorithms to analyze multi-parametric MRI, and produce new images indicating tumor-rich targets in GBM.
Methods: We recruited primary GBM patients undergoing image-guided biopsies and acquired pre-operative MRI: CE-MRI, Dynamic-Susceptibility-weighted-Contrast-enhanced-MRI, and Diffusion Tensor Imaging. Following image coregistration and region of interest placement at biopsy locations, we compared MRI metrics and regional texture with histologic diagnoses of high- vs low-tumor content (≥80% vs <80% tumor nuclei) for corresponding samples. In a training set, we used three texture analysis algorithms and three ML methods to identify MRI-texture features that optimized model accuracy to distinguish tumor content. We confirmed model accuracy in a separate validation set.
Results: We collected 82 biopsies from 18 GBMs throughout ENH and BAT. The MRI-based model achieved 85% cross-validated accuracy to diagnose high- vs low-tumor in the training set (60 biopsies, 11 patients). The model achieved 81.8% accuracy in the validation set (22 biopsies, 7 patients).
Conclusion: Multi-parametric MRI and texture analysis can help characterize and visualize GBM’s spatial histologic heterogeneity to identify regional tumor-rich biopsy targets.
- Author (aut): Hu, Leland S.
- Author (aut): Ning, Shuluo
- Author (aut): Eschbacher, Jennifer M.
- Author (aut): Gaw, Nathan
- Author (aut): Dueck, Amylou C.
- Author (aut): Smith, Kris A.
- Author (aut): Nakaji, Peter
- Author (aut): Plasencia, Jonathan
- Author (aut): Ranjbar, Sara
- Author (aut): Price, Stephen J.
- Author (aut): Tran, Nhan
- Author (aut): Loftus, Joseph
- Author (aut): Jenkins, Robert
- Author (aut): O'Neill, Brian P.
- Author (aut): Elmquist, William
- Author (aut): Baxter, Leslie C.
- Author (aut): Gao, Fei
- Author (aut): Frakes, David
- Author (aut): Karis, John P.
- Author (aut): Zwart, Christine
- Author (aut): Swanson, Kristin R.
- Author (aut): Sarkaria, Jann
- Author (aut): Wu, Teresa
- Author (aut): Mitchell, J. Ross
- Author (aut): Li, Jing
- Contributor (ctb): Ira A. Fulton Schools of Engineering