Cryogenic Vacuum In-Situ Device Calibration

I present a trade-study of methods for a 1-port vacuum cryogenic in-situ calibration of a vector network analyzer. The three main methods I investigated in this work were: calibration using a commercial off the shelf latching electro-mechanical six way switch, a custom switch board, and a flexible multi channel stripline based printed circuit board. The test procedure was developed for use in a ground based closed-cycle cryogenic test bench to measure the reflection coefficient of a single port connectorized device under test. The device was installed in the cryogenic system alongside calibration standards. The goal of the trade study was to find which method could be used to accomplish calibration and device measurement in a single thermal cycle. Four cycles were required for industry standard open-short-load device calibration. Room temperature measurements were done with all three calibration schemes but ultimately only the single pole six throw switch proved effective enough for further testing. The cryogenic testing was carried out on an arbitrary device at ∼ 3K temperature, over a 6 GHz bandwidth. The final objective was to develop a setup and procedure for measuring the frequency and temperature dependent complex impedance of superconducting devices such as hot electron bolometer mixers, which are used for down converting the signal in the IF chain of astronomy instruments. Characterization of superconducting devices while they are at their operating temperature is challenging using traditional calibration methods. This commercial alternative is less expensive and more efficient in terms of thermal cycles and set up because it can be installed in a wide variety of cyrogenic systems.