Accelerometer Test Time Reduction with Machine Learning

With the steady advancement of neural network research, new applications are continuously emerging. As a tool for test time reduction, neural networks provide a reliable method of identifying and applying correlations in datasets to speed data processing. By leveraging the power of a deep neural net, it is possible to record the motion of an accelerometer in response to an electrical stimulus and correlate the response with a trim code to reduce the total test time for such sensors. This reduction can be achieved by replacing traditional trimming methods such as physical shaking or mathematical models with a neural net that is able to process raw sensor data collected with the help of a microcontroller. With enough data, the neural net can process the raw responses in real time to predict the correct trim codes without requiring any additional information. Though not yet a complete replacement, the method shows promise given more extensive datasets and industry-level testing and has the potential to disrupt the current state of testing.